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All testers have the following features:
Large 40 characters x 16 lines or 240 dots x 128 dots LC display and 25-key keyboard
87C196 16-bit microprocessor controller with high speed 14-bit A/D converter
High voltage is generated by a small high frequency transformer
Versatile interface settings for easy connection with machine handlers
4 to 10 sets of programmed parameters can be stored
RS-232 serial port interface
Real contact resistance value test
Slot mounted PC boards with on-board calibration
Standard 19" instrument rack case
The testers are available for either 220V/50Hz or 110V/60Hz AC power source. All parameters can be set via the keyboard or downloaded from an IBM compatible PC via RS 232 interface. The PC download software is optionally available. All testers can be linked with the handler via a direct interface or by PLC.
The following test systems are available:
DS-800S (Diode Tester)
Model DS-800S is designed to test VF, VZ, Delta VZ, IR and Delta IR of regular and Schottky diodes. 7 bin grades (incl. test fail and bad contact) are programmable.
DS-800T (Diode/Transistor Tester)
Model DS-800T is designed to test VF, VZ, Delta VZ and IR of 2 diodes building a power transistor (can often be found in TO-220 or TO-3P packages). 7 bin grades (incl. test fail and bad contact) are programmable.
DS-812T (Diode/Transistor Tester)
Model DS-812T is designed to test VF, IR and Delta IR of 2 diodes building a power transistor (can often be found in TO-220 or TO-3P packages). 2 components can be tested simultaneously 7 bin grades (incl. test fail and bad contact) are programmable.
DS-4148 (Diode Tester)
Model DS-4148 is a tester designed to test 1N4148 small signal diodes. Test items include VF and IR. 7 bin grades (incl. test fail and bad contact) are programmable.
TVS-801 (Diode Tester)
Model TVS-801 is designed to test and sort uni-polar (rectifier) and bipolar TVS, Schottky and zener diodes. The test items include VF, VZ, Delta VZ, IR (%VZ) and Delta IR. 7 bin grades (incl. test fail and bad contact) are programmable.
DVF-800 (Diode Tester)
Model DVF-800 is designed to test the VF and Delta VF of different kinds of diodes. 7 bin grades (incl. test fail and bad contact) are programmable.
ZT-800 (Diode Tester)
Model ZT-800 is a tester designed to test VF, IR, VZ and dynamic impedance Zzt & Zzk of zener diodes. It also can test unidirectional and bi-directional zener diodes. 7 bin grades (incl. test fail and bad contact) are programmable.
Series FR-800 (Diode Testers)
The FR-800 series was designed to test the diode reverse recovery time (Trr), also known as switching time, of many different diode products. Model FR-800 is suitable for single diode packages, model FR-800B for multi diode bridge rectifiers and model FR-800T for diodes in power transistor packages like TO-220 or TO-3P. 7 bin grades (incl. test fail and bad contact) are programmable.
SG-800 (Surge Tester)
Model SG-800 can generate a reverse surge current and test the VR voltage. Another test method is to test the IR voltage first and than to supply a constant reverse power (by controlled IR). The test items include VF and PIV. Model SG-800 can be applied to test all silicon diode types. 5 bin grades (incl. bad contact) are programmable.
SS-802T (Schottky Diode Surge Tester)
Model SS-802T is a surge tester for Schottky diodes either in power transistor packages such as TO-220 or TO-3P. 2 components can be tested simultaneously. 7 bin grades (incl. test fail and bad contact) are programmable.
VC-800 (Clamping Voltage Tester)
Model VC-800 is a tester designed to determine the clamping voltage (VC) and forward voltage (VF) of uni-polar and bipolar Transient Voltage Suppressors (TVS) and to classify the components. The peak power is 1,500W. 7 bin grades (incl. test fail and bad contact) are programmable.
VC-805 (Clamping Voltage Tester)
Model VC-800 is a tester designed to determine the clamping voltage (VC) and forward voltage (VF) of uni-polar and bipolar Transient Voltage Suppressors (TVS) and to classify the components. The peak power is 5,000W. 7 bin grades (incl. test fail and bad contact) are programmable.
BS-802 (Bridge Rectifier Tester)
The BS-802 tester is designed to test bridge rectifiers. The tester can easily be linked to two machine handlers or two manual test boxes. The test items include VF, IR and Delta VR. 7 bin grades (incl. test fail and bad contact) are programmable.
LED-822 (LED and Photodiode Tester)
Model LED-822 is a tester designed to test the electrical and optical characteristics of Light Emitting Diodes (LED). The test items include LOP, VF, VZ, IR and VFD. 12 bin grades (incl. test fail and bad contact) are programmable.
LED-825 (LED Tester)
Model LED-825 is a tester designed to test the electrical and optical characteristics of Light Emitting Diodes (LED). The test items include LOP, VF, VFD, VZ, IR, WP and WD. 24 bin grades (incl. test fail and bad contact) are programmable.
PTS-800 (Photodiode and Phototransistor Tester)
Model PTS-800 is a tester designed to test and sort a wide range of photodiodes and phototransistors. The test items include BVceo, BVeco, Iceo and Icel 12 bin grades (incl. test fail and bad contact) are programmable
An optional available tester rack can contain all kinds of the above mentioned testers and up to 35 units (equal to 1,540 mm). The rack is mounted with four movable wheels so that it can be moved easily. |
